c-sense develops, produces and distributes worldwide sensors and sensor modules based on self-sensing cantilever-technology for scientific and industrial applications, where micro- or nanometer resolution is necessary. This can be reached with its self-developed technology, extensive experience and broad research network.
R&D:Self-sensing cantilevers and correlated analysis for the following applications: • KPFM and electrical probing, Conductive-AFM (C-AFM) (50 nm Pt-coated tips) and MFM. • Integration on standard AFM scanner, high-speed AFM. • Force or deflection measurements. • Measurements within TEM, SEM, XPS, etc. Pt coating on the chip body to avoid surface charging. • Measurements in (opaque/conductive) liquids.
Production:We develop sensors, which can be implemented in production processes for quality control (e.g. surface analysis of wafers, etc.) with nanometer resolution.
Services:We offer research and production services for specific applications/devices (Cantilevers, MEMs, etc.) where self-sensing cantilevers can be used for deviation or force measurements with nanometer of sub-micro Newton resolution.
Sales/Distribution:We sell this products, devices & services globally, mainly to research & development groups/institutes/companies.
Dechantstr. 9
3550 Langenlois
Lower Austria
Contact:
Telephone: 436644141205
Email: tf@c-sense.at
Website